Upcoming Technical Events

Future presentations will be listed here when available.

Recent Technical Events

“Real Time Observation of Surface Potential with an EFM on CTL” was presented by Trek's Mr. Uehara during the Photoelectronic Imaging and Devices session at the Imaging Science & Technology’s Digital Printing Technologies Conference (IS&T/ NIP25) on Monday September 21, 2009 during NIP Track 4, Photoelectronic Imaging Materials and Devices, in Louisville, Kentucky. Program Information  
PDF of Presentation

2008:

“Evaluation of Surface Charge Density with Electrostatic Voltmeter – Measurement Geometry Consideration” , a paper co-authored by TREK’s Apra Pandey and Maciej Noras from the University of North Carolina at Charlotte, was presented at the 2008 IEEE Industrial Applications Society Annual Meeting on Tuesday, October 7, 2008 (Session 22), in Edmonton, Alberta, Canada. Meeting Information

"An Analysis on both Voltage Sensitivity and High Spatial Resolution with a New Electrostatic Voltmeter Having Extremely High Input Impedance" was presented by Trek’s Mr. Uehara at the Imaging Science & Technology's Digital Printing Technologies Conference (IS&T/NIP24) on Monday, September 8, 2008 during NIP Track 3 during the Photoelectronic Imaging Materials and Devices session, in Pittsburgh, Pennsylvania.
Program Information

"Considerations for CPM Measurements of Fast Switching Ionizers” was presented by Trek at the 2008 Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) on Tuesday, September 9, 2008 during Session 2B, in Tucson, Arizona.
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Trek sponsored the Intelligent Sensors and Actuators Symposium at the 2008 Earth & Space Conference held in Long Beach, California. Included in this symposium was an “Active Vibration Control Student Design Competition” which featured piezoceramic technology. A Trek piezo amplifier served as the power supply.
Symposium Information
Student Competition Results:
Graduate Design Competition Summary
Undergraduate Design Competition Summary

2007:

“High-Voltage Power Supply” was presented by Trek at the 50th ICAT/JTTAS Joint International Smart Actuator Symposium, hosted by the International Center for Actuators and Transducers, on Wednesday, October 10, 2007 in State College, Pennsylvania.
Symposium Brochure

"Monitoring of Electric Potential of Semiconductor Wafer” was presented by Trek at the 9th International Plasma-Based Ion Implantation & Deposition Workshop on September 4, 2007, during Session 4 Semiconductors, in Leipzig, Germany.
Program Information

"Air Ionizer Monitoring and Control with Sectioned Charged Plate Sensor" was presented by Trek at the Electrostatics Society of America (ESA) 35th Annual Meeting on Electrostatics on June 14, 2007, during the Measurement and Instrumentation session, in West Lafayette, Indiana. The title in the preliminary program was “Ion Balance and Density Monitoring for Air Ionizers Evaluation”.
Program Information

"An Apparatus for the Charge-to-Mass and Charge-to-Diameter Measurements on Powders " was presented by Trek at the 12th International Conference on Electrostatics 2007 on March 29, 2007 during the Powders & Aerosols Session, in Oxford, United Kingdom.
Program Information

“Electrostatic Measurements on Semiconductors” was presented by Trek at the SEMI North America Spring 2007 Standards Meeting on March 4, 2007 in Boston, Massachusetts.

"Non-Contacting Electrostatic Voltmeter for Wafer Potential Monitoring” was presented by Trek at the 2007 SPIE Advanced Lithography Conference on Monday, February 26, 2007 during the Poster Session, in San Jose, California.
Program Information

Prior Technical Presentations

Our Technical Expertise can be seen by just glancing at all of the technical presentations Trek has been involved with over the years.
More Information