Recent Technical Presentations

2011:

“A New Field Nullification Method for Electrostatic Force Microscope (EFM) for Unknown High Voltage Measurement” a paper co-authored by Trek and Nihon University was presented at the Imaging Science & Technology’s Digital Printing Technologies Conference (IS&T/NIP27) on Wednesday, October 5, 2011 during NIP Track 2 Photoelectronic Imaging Materials and Devices session, in Minneapolis, Minnesota. This paper was initially submitted to the conference with the following title: “A New Sensor Adjacent Methodology for High Spatial Resolution and High Voltage Measurement”.
Conference Information
PDF of Presentation

“Surface Potential Measurement Technology: Contacting and Non-Contacting Technique for Static Charge” was presented by Trek's Mr. Shinichi Yamaguchi from at 6th Philippine ESD Forum in conjunction with the 21st ASEMEP National Technical Symposium on Friday June 3, 2011.
Conference Information

2009:

“Real Time Observation of Surface Potential with an EFM on CTL” was presented by Trek's Mr. Uehara during the Photoelectronic Imaging and Devices session at the Imaging Science & Technology’s Digital Printing Technologies Conference (IS&T/ NIP25) on Monday September 21, 2009 during NIP Track 4, Photoelectronic Imaging Materials and Devices, in Louisville, Kentucky.
Program Information  
PDF of Presentation

2008:

“Evaluation of Surface Charge Density with Electrostatic Voltmeter – Measurement Geometry Consideration” , a paper co-authored by Trek’s Apra Pandey and Maciej Noras from the University of North Carolina at Charlotte, was presented at the 2008 IEEE Industrial Applications Society Annual Meeting on Tuesday, October 7, 2008 (Session 22), in Edmonton, Alberta, Canada.
Meeting Information

"An Analysis on both Voltage Sensitivity and High Spatial Resolution with a New Electrostatic Voltmeter Having Extremely High Input Impedance" was presented by Trek’s Mr. Uehara at the Imaging Science & Technology's Digital Printing Technologies Conference (IS&T/NIP24) on Monday, September 8, 2008 during NIP Track 3 during the Photoelectronic Imaging Materials and Devices session, in Pittsburgh, Pennsylvania.
Program Information

"Considerations for CPM Measurements of Fast Switching Ionizers” was presented by Trek at the 2008 Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) on Tuesday, September 9, 2008 during Session 2B, in Tucson, Arizona.
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Trek sponsored the Intelligent Sensors and Actuators Symposium at the 2008 Earth & Space Conference held in Long Beach, California. Included in this symposium was an “Active Vibration Control Student Design Competition” which featured piezoceramic technology. A Trek piezo amplifier served as the power supply.
Symposium Information
Student Competition Results:
Graduate Design Competition Summary
Undergraduate Design Competition Summary

Prior Technical Presentations

Our Technical Expertise can be seen by just glancing at all of the technical presentations Trek has been involved with over the years.
Go to past presentations